MICROSCOPY
Keyence VHX-5000
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Real-time depth composition (z-axis)
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Multi-angle observation
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Light-shift function
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3D display function
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Transmission and reflection modes
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Lenses available: x20-x200 and x250-x2500
Carl Zeiss Standard Binocular Microscope with Cross Polarizer, Mettler Toledo Hot Stage FP82 and AxioCam Zeiss camera
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Up to x40 magnification
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Ramp (up to 20 C min-1) or isothermal heating mode
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Ability to capture images at a rate of 1 image sec-1
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Follow morphological changes as samples is heated e.g. melting, recrystallization etc.
SMZ-U Stereoscopic Zoom Microscope
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Magnification up to x10
LEO 1530Vwith Zyvex Nanomanipulator System/Cryo-system
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Three detectors available: secondary electron, multiple secondary electron and backscattered electron detector
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INCA energy system for semi-quantitative elemental analysis
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Cryo system for imaging hydrated samples
Bruker Dimension ICON AFM
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Multiple AFM modes: Contact, Tapping, Non-contact and PeakForce Mode
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Ability to image samples in both air and liquids
For more information please contact: ​​
Nikolaos Ioannidis
nxi145@njit.edu
973-596-6092